Atomic Force Microscopy: Introduction – Measurement in tapping mode

In this short course you will learn more about tapping mode, the most widely used mode for topographic imaging. You will learn why this mode is a so-called ‘non-contact’ mode, what its advantages are and why it is the prefect mode for sensitive samples. 

今すぐアクセスする

フォームに必要事項を入力して、制限付きコンテンツに自由にアクセスする

読み込み中...

エラー