Particle sizing can be quite confusing at first glance, considering the wide range of methods and the corresponding devices. There are many well-established measurement principles, and different methods can be selected depending on the sample’s properties. However, the measurement results for the same sample can differ significantly.
This article aims to clarify how different sizing methods work and explain how to compare the results from different measurement techniques. It gives a brief overview and comparison of the most common particle sizing techniques for nano- to micron-ranged particles, including laser diffraction, sieving, image analysis, the Coulter measuring principle, and nanoparticle tracking analysis (NTA). It also evaluates their advantages and disadvantages.